Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
FormFactor has announced the latest addition to its TrueScale probe-card family for wire-bond system-on-chip (SOC) devices. Offering scalability down to a 40-micron pad pitch, the TrueScale PP40 wafer ...
FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment ...
LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
HSINCHU, June 14, 2023 /PRNewswire/ -- STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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