Recently, a research team led by Prof. CHEN Tao from the University of Science and Technology of China (USTC) of the Chinese Academy of Sciences (CAS) revealed the formation and evolution of the point ...
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AI-based model measures atomic defects in materials
In biology, defects are generally bad. But in materials science, defects can be intentionally tuned to give materials useful new properties. Today, atomic-scale defects are carefully introduced during ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
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